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On the Application of X-ray Microtomography in the Field of Materials Science

✍ Scribed by E. Maire; J. Y. Buffière; L. Salvo; J. J. Blandin; W. Ludwig; J. M. Létang

Publisher: John Wiley and Sons
Year: 2001
Tongue: English
Weight: 481 KB
Volume: 3
Category: Article
ISSN: 1438-1656
DOI: 10.1002/1527-2648(200108)3:8<539::aid-adem539>3.0.co;2-6

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