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On finding minimal-length test sets for diagnosing faults in combinational circuits

✍ Scribed by William E. Pierson; Paul D. Stigall

Book ID: 113211555
Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 412 KB
Volume: 3
Category: Article
ISSN: 0045-7906
DOI: 10.1016/0045-7906(76)90027-6

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