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On diagnosis and diagnostic test generation for pattern-dependent transition faults

✍ Scribed by Pomeranz, I.; Reddy, S.M.

Book ID: 119778790
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 271 KB
Volume: 20
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.924832

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