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On diagnosis and diagnostic test generation for pattern-dependent transition faults

✍ Scribed by Pomeranz, I.; Reddy, S.M.


Book ID
119778790
Publisher
IEEE
Year
2001
Tongue
English
Weight
271 KB
Volume
20
Category
Article
ISSN
0278-0070

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## Abstract As a technique for complementing the long testing time, which is a shortcoming of pseudo‐random pattern test, we will propose a BIST‐oriented test pattern generator (TPG) which achieves high fault detection efficiency with a short testing time for transition faults. The proposed TPG is