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On-chip characterization of interconnect parameters and time delay in 0.18 μm CMOS technology for ULSI circuit applications

✍ Scribed by Hi-Deok Lee; Kim, D.M.; Myoung-Jun Jang

Book ID
114538161
Publisher
IEEE
Year
2000
Tongue
English
Weight
300 KB
Volume
47
Category
Article
ISSN
0018-9383

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