On automatic-verification pattern generation for SoC with port-order fault model

✍ Scribed by Chun-Yao Wang; Shing-Wu Tung; Jing-Yang Jou

• Book ID: 119778889
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 487 KB
• Volume: 21
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/43.992770