An automorphic approach to verification pattern generation for SoC design verification using port-order fault model

✍ Scribed by Chun-Yao Wang; Shing-Wu Tung; Jing-Yang Jou

• Book ID: 118698300
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 348 KB
• Volume: 21
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2002.802266