[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - 3D Active Shape Model for Automatic Facial Landmark Location Trained with Automatically Generated Landmark Points

[IEEE 2010 20th International Conference

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[IEEE 2010 20th International Conference

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[IEEE 2010 20th International Conference

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[IEEE 2010 20th International Conference

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[IEEE 2010 20th International Conference

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[IEEE 2010 20th International Conference

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