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OH-related capacitance-voltage recovery effect in MOS capacitors passivated by ZnO-B2OP3O-P2O5O-SiO2glasses IV. The effects of BaO content

✍ Scribed by K. Kobayashi

Book ID: 118288142
Publisher: Springer
Year: 1994
Tongue: English
Weight: 164 KB
Volume: 13
Category: Article
ISSN: 0261-8028
DOI: 10.1007/bf00626500

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