OH-related capacitance-voltage recovery effect in MOS capacitors passivated by ZnO-B2O3-SiO2-P2O5glasses part VIIIthe effects of SrF2and BeO contents

✍ Scribed by Keiji Kobayashi; Ichiro Mizushima

• Publisher: Springer
• Year: 1996
• Tongue: English
• Weight: 220 KB
• Volume: 15
• Category: Article
• ISSN: 0261-8028
• DOI: 10.1007/bf00591662