Observations of dislocations and junction irregularities in bipolar transistors using the E.B.I.C. mode of the scanning electron microscope: P. Ashburn and C. J. Bull Solid-St. Electron. 22, 105 (1979)

• Book ID: 108361080
• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 132 KB
• Volume: 11
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(80)80328-4