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Observation of transient current induced in silicon carbide diodes by ion irradiation

✍ Scribed by Takeshi Ohshima; Kin K. Lee; Shinobu Onoda; Tomihiro Kamiya; Masakazu Oikawa; Jamie S. Laird; Toshio Hirao; Hisayoshi Itoh

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of charge generated in

✍ T. Ohshima; T. Satoh; M. Oikawa; T. Yamakawa; S. Onoda; T. Wakasa; J.S. Laird; T 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 295 KB

Structural changes induced by helium ion

✍ K. Hojou; K. Izui 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 524 KB

Alpha-, boron-, silicon- and iron-ion-in

✍ Wagner, R.S.; Bordes, N.; Bradley, J.M.; Maggiore, C.J.; Knudson, A.R.; Campbell 📂 Article 📅 1988 🏛 IEEE 🌐 English ⚖ 649 KB

Irradiation effects induced in silicon c

✍ A. Benyagoub 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 183 KB

Formation of dislocation loops in silico

✍ M. Milosavljević; M.A. Lourenço; G. Shao; R.M. Gwilliam; K.P. Homewood 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 480 KB

Comparative study of transient current i

✍ Takeshi Ohshima; Naoya Iwamoto; Shinobu Onoda; Tomihiro Kamiya; Katsuyasu Kawano 📂 Article 📅 2009 🏛 Elsevier Science 🌐 English ⚖ 310 KB