Comparative study of transient current induced in SiC p+n and n+p diodes by heavy ion micro beams

✍ Scribed by Takeshi Ohshima; Naoya Iwamoto; Shinobu Onoda; Tomihiro Kamiya; Katsuyasu Kawano

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 310 KB
• Volume: 267
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2009.03.056