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Observation of the V2O5(001) surface using ambient atomic force microscopy

✍ Scribed by Antonio Da Costa; Christian Mathieu; Yolande Barbaux; Hilde Poelman; Gisele Dalmai-Vennik; Lucien Fiermans


Book ID
117216755
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
371 KB
Volume
370
Category
Article
ISSN
0039-6028

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Atomic force microscopy investigation of
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The surface topography development of InP as a function of ion energy and incident angle was investigated O 2 ' using atomic force microscopy (AFM). Cone formation was found to be the dominant surface feature under various ion bombarding conditions. However, variations in the density and size of the