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Observation of ripple formation on O2+-irradiated GaN surfaces using atomic force microscopy

✍ Scribed by M. Kanazawa; A. Takano; Y. Higashi; M. Suzuki; Y. Homma


Book ID
108417848
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
129 KB
Volume
203-204
Category
Article
ISSN
0169-4332

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