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Observation of the NΓ−x line in GaAs0.42P0.58:N

✍ Scribed by M. V. Chukhichev; V. I. Petrov; R. Stegmann


Publisher
John Wiley and Sons
Year
1986
Tongue
English
Weight
190 KB
Volume
135
Category
Article
ISSN
0370-1972

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Depth profiling of nitrogen using 429&#x
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Resonances at 429 keV and 897 keV in the 15 N(p, ac) 12 C reaction were investigated for depth profiling nitrogen in materials containing nitrogen isotopes in natural abundances. Both resonances exhibit identical sensitivity, however the resonance at 897 keV is prone to interferences from light elem