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Observation of strain relaxation in Si1-xGex layers by optical and electrical characterisation of a Schottky junction

✍ Scribed by R. Turan; B. Aslan; O. Nur; M.Y.A. Yousif; M. Willander

Publisher: Springer
Year: 2001
Tongue: English
Weight: 224 KB
Volume: 72
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s003390100827

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