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Observation of strain effects in semiconductor dots depending on cap layer thickness

✍ Scribed by Pistol, M.-E.; Carlsson, N.; Persson, C.; Seifert, W.; Samuelson, L.


Book ID
121282809
Publisher
American Institute of Physics
Year
1995
Tongue
English
Weight
322 KB
Volume
67
Category
Article
ISSN
0003-6951

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