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Observation of “capacitance overshoot” in the transient current measurement of polysilicon TFT's

✍ Scribed by Tam, S.W.-B.; Migliorato, P.; Lui, O.K.B.; Quinn, M.J.


Book ID
114537527
Publisher
IEEE
Year
1999
Tongue
English
Weight
173 KB
Volume
46
Category
Article
ISSN
0018-9383

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