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Investigation of the low field leakage current mechanism in polysilicon TFT's

✍ Scribed by Lui, O.K.B.; Quinn, M.J.; Tam, S.W.-B.; Brown, T.M.; Migliorato, P.; Ohshima, H.


Book ID
114537177
Publisher
IEEE
Year
1998
Tongue
English
Weight
136 KB
Volume
45
Category
Article
ISSN
0018-9383

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