Investigation of low field and high temperature SiO2 and ONO leakage currents using the floating gate technique

✍ Scribed by B De Salvo; G Ghibaudo; G Pananakakis; B Guillaumot

• Book ID: 117149530
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 198 KB
• Volume: 245
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/s0022-3093(98)00855-2