✦ LIBER ✦
SPIE Proceedings [SPIE Lightmetry - Pultusk, Poland (Monday 5 June 2000)] Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light - Spectroscopic ellipsometry investigation of influence of high-pressure high-temperature process on optical properties of SiO2-Si structures
✍ Scribed by Rzodkiewicz, Witold; Kudla, Andrzej; Misiuk, Andrzej; Lasisz, Stanislaw; Pluta, Maksymilian
- Book ID
- 111967456
- Publisher
- SPIE
- Year
- 2001
- Weight
- 366 KB
- Volume
- 4517
- Category
- Article
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