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Observation of Bulk Traps in Ion-Implanted GaAs MESFETs

✍ Scribed by Blight, S. R. ;Thomas, H.

Publisher: John Wiley and Sons
Year: 1989
Tongue: English
Weight: 246 KB
Volume: 112
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211120168

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