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Numerical modeling of RF noise in scaled MOS devices

✍ Scribed by C. Jungemann; B. Neinhüs; C.D. Nguyen; A.J. Scholten; L.F. Tiemeijer; B. Meinerzhagen

Book ID: 108269510
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 419 KB
Volume: 50
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2005.10.037

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