## Abstract Growing device‐quality 3C‐SiC monocrystalline material is still an issue despite two decades of work dedicated to the subject. Using silicon as the substrate generates too many defects in the layers, owing to lattice mismatch, while it is very difficult to control the initial nucleation
Nucleation of 3C–SiC on 6H–SiC from a liquid phase
✍ Scribed by Maher Soueidan; Gabriel Ferro; Olivier Kim-Hak; Florence Robaut; Olivier Dezellus; Jacques Dazord; François Cauwet; Jean-Claude Viala; Bilal Nsouli
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 762 KB
- Volume
- 55
- Category
- Article
- ISSN
- 1359-6454
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✦ Synopsis
The aim of this work is to elucidate the mechanism involved in the 3C-SiC formation during growth by a vapor-liquid-solid mechanism on 6H-SiC substrate. Polytype selection is shown to occur at the first stage of the experiments, before propane injection into the reactor. The contact of the seed with a Si-Ge melt during the initial heating ramp causes the formation of 3C-SiC islands on the seed surface, probably below 1200 °C. The proposed mechanism first involves a partial dissolution of the seed in a Ge-rich liquid which becomes C-supersaturated. Then the Si content of the liquid rapidly increases, which provokes the precipitation of the dissolved carbon in the form of 3C-SiC islands. When growth starts upon propane injection, these islands enlarge and coalesce to form a continuous 3C-SiC layer. If the growth temperature is too high (P1550 °C), the initial 3C-SiC islands are dissolved and homoepitaxial layers are obtained.
📜 SIMILAR VOLUMES
## Abstract This article describes growth and characterization of the highest quality reproducible 3C‐SiC heteroepitaxial films ever reported. By properly nucleating 3C‐SiC growth on top of perfectly on‐axis (0001) 4H‐SiC mesa surfaces completely free of atomic scale steps and extended defects, gro
Epitaxial 3C-SiC(1 1 1) films were grown on 6H-SiC(0 0 0 1) Si face on axis substrates by chemical vapor deposition under H 2 , SiH 4 and C 3 H 8 in a cold wall vertical reactor. Two temperatures were studied (1450 and 1700 • C) with various C/Si ratio and deposition time. It was found that under co