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NRA and XPS characterizations of layers formed by rapid thermal nitridation of thin SiO2 films

✍ Scribed by J-J. Ganem; S. Rigo; I. Trimaille; G-N. Lu; G. Dufour; H. Roulet


Book ID
113283030
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
435 KB
Volume
64
Category
Article
ISSN
0168-583X

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