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Novel test pattern generators for pseudoexhaustive testing

✍ Scribed by Srinivasan, R.; Gupta, S.K.; Breuer, M.A.

Book ID: 119773208
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 313 KB
Volume: 49
Category: Article
ISSN: 0018-9340
DOI: 10.1109/12.895939

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