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Notes on the handling of position and broadening errors in deconvoluted X-ray diffraction line profiles

✍ Scribed by de Keijser, Th. H. ;Mittemeijer, E. J.

Book ID: 114499113
Publisher: International Union of Crystallography
Year: 1980
Tongue: English
Weight: 444 KB
Volume: 13
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889880011521

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