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On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials

✍ Scribed by Jiang, H. G.; Rühle, M.; Lavernia, E. J.


Book ID
118209267
Publisher
Cambridge University Press
Year
1999
Tongue
English
Weight
383 KB
Volume
14
Category
Article
ISSN
0884-2914

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