✦ LIBER ✦

Nonlocal effects in thin 4H-SiC UV avalanche photodiodes

✍ Scribed by Ng, B.K.; David, J.P.R.; Tozer, R.C.; Rees, G.J.; Feng Yan; Zhao, J.H.; Weiner, M.

Book ID: 114617177
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 672 KB
Volume: 50
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2003.815144

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Performance of thin 4H-SiC UV avalanche

Performance of thin 4H-SiC UV avalanche photodiodes

✍ Ng, B.K.; David, J.P.R.; Tozer, R.C.; Rees, G.J.; Yan, F.; Qin, C.; Zhao, J.H. 📂 Article 📅 2003 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 253 KB

Multiplication and excess noise characte

Multiplication and excess noise characteristics of thin 4H-SiC UV avalanche photodiodes

✍ Ng, B.K.; Yan, F.; David, J.P.R.; Tozer, R.C.; Rees, G.J.; Qin, C.; Zhao, J.H. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 216 KB

Edge breakdown in 4H-SiC avalanche photo

Edge breakdown in 4H-SiC avalanche photodiodes

✍ Beck, A.L.; Bo Yang; Xiangyi Guo; Campbell, J.C. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 330 KB

Performance of Low-Dark-Current 4H-SiC A

Performance of Low-Dark-Current 4H-SiC Avalanche Photodiodes With Thin Multiplication Layer

✍ Xiangyi Guo; Beck, A.L.; Zhihong Huang; Ning Duan; Campbell, J.C.; Emerson, D.; 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 951 KB

Study of reverse dark current in 4H-SiC

Study of reverse dark current in 4H-SiC avalanche photodiodes

✍ Xiangyi Guo; Beck, A.L.; Xiaowei Li; Campbell, J.C.; Emerson, D.; Sumakeris, J. 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 756 KB

Boundary effects on multiplication noise

Boundary effects on multiplication noise in thin heterostructure avalanche photodiodes: theory and experiment [Al0.6Ga0.4As/GaAs]

✍ Hayat, M.M.; Oh-Hyun Kwon; Shuling Wang; Campbell, J.C.; Saleh, B.E.A.; Teich, M 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 593 KB