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Edge breakdown in 4H-SiC avalanche photodiodes

✍ Scribed by Beck, A.L.; Bo Yang; Xiangyi Guo; Campbell, J.C.

Book ID: 117882609
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 330 KB
Volume: 40
Category: Article
ISSN: 0018-9197
DOI: 10.1109/jqe.2003.823033

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