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Multiplication and excess noise characteristics of thin 4H-SiC UV avalanche photodiodes

✍ Scribed by Ng, B.K.; Yan, F.; David, J.P.R.; Tozer, R.C.; Rees, G.J.; Qin, C.; Zhao, J.H.

Book ID: 119800018
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 216 KB
Volume: 14
Category: Article
ISSN: 1041-1135
DOI: 10.1109/lpt.2002.801112

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