## Abstract In this paper, we present a new model to determine the dielectric constant and the loss tangent of dielectric material in the sheet/slab form, with both low and high relative permittivity. A nonβdestructive testing method is used, based on the microstrip patch and line resonators. This
β¦ LIBER β¦
Nondestructive permittivity measurement of substrates
β Scribed by Kent, G.
- Book ID
- 114543307
- Publisher
- IEEE
- Year
- 1996
- Tongue
- English
- Weight
- 532 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0018-9456
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Nondestructive measurement of complex pe
β
A. K. Verma; Nasimuddin
π
Article
π
2003
π
John Wiley and Sons
π
English
β 130 KB
Simple Nondestructive Method for the Mea
β
Decreton, Marc. C.; Gardiol, Fred E.
π
Article
π
1974
π
IEEE
π
English
β 991 KB
Nondestructive sensing of physical prope
β
Trabelsi, S.; Nelson, S.O.
π
Article
π
2006
π
IEEE
π
English
β 412 KB
Full-wave analysis of a split-cylinder r
β
Janezic, M.D.; Baker-Jarvis, J.
π
Article
π
1999
π
IEEE
π
English
β 245 KB
Permittivity measurement of Ba0.5Sr0.5Ti
β
Zheyao Wang; Jianshe Liu; Litian Liu
π
Article
π
2006
π
IEEE
π
English
β 295 KB
Measurement of complex permittivity of t
β
Ming-Yan Chen; Jian-Ping Yu; De-Ming Xu
π
Article
π
2004
π
John Wiley and Sons
π
English
β 112 KB
## Abstract An improved TE~01n~ resonantβcavity method for measuring the complex permittivity of thin substrates is presented. The theory and the experimental results are described in this paper. Β© 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 42: 274β277, 2004; Published online in Wiley