✦ LIBER ✦

Measurement of complex permittivity of thin substrates using the TE01n resonant cavity

✍ Scribed by Ming-Yan Chen; Jian-Ping Yu; De-Ming Xu

Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 112 KB
Volume: 42
Category: Article
ISSN: 0895-2477
DOI: 10.1002/mop.20276

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✦ Synopsis

Abstract

An improved TE~01n~ resonant‐cavity method for measuring the complex permittivity of thin substrates is presented. The theory and the experimental results are described in this paper. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 42: 274–277, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20276

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