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Nondestructive detection of defects in miniaturized multilayer ceramic capacitors using digital speckle correlation techniques

✍ Scribed by Y. Chan; Fan Yeung; Guangchang Jin; Naikong Bao; P. Chung

Book ID: 126696839
Publisher: IEEE
Year: 1995
Tongue: English
Weight: 969 KB
Volume: 18
Category: Article
ISSN: 1070-9886
DOI: 10.1109/95.465169

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