Nondestructive detection of defects in miniaturized multilayer ceramic capacitors using digital speckle correlation techniques : Y. C. Chan et al. IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part A, 18 (3), 677 (September 1995).

• Book ID: 108362329
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 116 KB
• Volume: 37
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(97)87804-3