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Nondestructive analysis of thin surface layers of materials for hydrogen content

✍ Scribed by I. P. Chernov; V. V. Kozyr'; V. A. Matusevich

Book ID
105085414
Publisher
Springer US
Year
1976
Tongue
English
Weight
238 KB
Volume
41
Category
Article
ISSN
1573-8205

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In many areas of material sciences, hydrogen analysis is of particular importance. For example, hydrogen is most abundant as impurity in thin film materials -depending on the deposition process -and has great influence on the chemical, physical and electrical properties of many materials. Existing b