A thin-layer reference material for hydrogen analysis

✍ Scribed by Uwe Reinholz; Wolfram Bremser; Klaus-Werner Brzezinka; Erik Strub; Hans-Peter Weise; Silke Merchel

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 210 KB
• Volume: 266
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2008.03.015

✦ Synopsis

In many areas of material sciences, hydrogen analysis is of particular importance. For example, hydrogen is most abundant as impurity in thin film materials -depending on the deposition process -and has great influence on the chemical, physical and electrical properties of many materials. Existing bulk reference materials (RMs) are not suited for surface sensitive analytical methods like elastic recoil detection analysis (ERDA) or nuclear reaction analysis (NRA). To overcome this serious lack of (certified) thin-layer reference materials for the determination of hydrogen in the near-surface region (1-2 lm depth), we produced stable, homogeneous amorphous silicon layers on Si-wafers (aSi:H-Si) by means of chemical vapour deposition (CVD), while about 10% of hydrogen was incorporated in the Si-layer. Homogeneity and stability were proved by NRA whereas traceability of reference values has been assured by an international interlaboratory comparison.