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Non-homogeneous electrical transport through silicon-on-sapphire thin films: evidence of the internal stress influence : John-Hyun Lee, Sorin Cristoloveanu and Alain Chovet. Solid-St. Electron.25 (9), 947 (1982)

Book ID
107829655
Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
115 KB
Volume
23
Category
Article
ISSN
0026-2714

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Non-homogeneous electrical transport thr
Non-homogeneous electrical transport through silicon-on-sapphire thin films: evidence of the internal stress influence: John-Hyun Lee, Sorin Cristoloveanu and Alain Chovet Solid-St. Electron. 25 (9), 947 (1982)
๐Ÿ“‚ Article ๐Ÿ“… 1984 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 192 KB

regular production line which contained two resistorone with ~ (t/w)> 1 where an L cut/Vernier cut combination was used for trimming and the other with AR < 1 where a P cut/Vernier cut combination was used. The post trim resistors' performance was studied under two ~onditions -one at room temperatur