Non-homogeneous electrical transport through silicon-on-sapphire thin films: Evidence of the internal stress influence

✍ Scribed by Jong-Hyun Lee; Sorin Cristoloveanu; Alain Chovet

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 720 KB
• Volume: 25
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(82)90186-1