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Non-destructive spectroscopic characterization of parchment documents

✍ Scribed by Marina Bicchieri; Michela Monti; Giovanna Piantanida; Flavia Pinzari; Armida Sodo


Book ID
108298578
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
586 KB
Volume
55
Category
Article
ISSN
0924-2031

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πŸ“œ SIMILAR VOLUMES


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Non-destructive characterization of nitr
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## 1. Introduction Silicon-on-insulator (SO1) structures implanted with 200 or 400 keV N Γ· ions at a dose of 7.5Γ—1017cm 2 were studied by spectroscopic ellipsometry (SE). The SE measurements were carried out in the 300-700 nm wavelength (4.13-1.78 eV photon energy) range. The SE data were analysed