𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Non-destructive determination of step coverage on semiconductor wafers

✍ Scribed by W.H. Johnson; B. Brennan


Book ID
107864906
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
514 KB
Volume
270
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Non-destructive, room temperature charac
✍ Huang, Y. S. ;Pollak, F. H. 📂 Article 📅 2005 🏛 John Wiley and Sons 🌐 English ⚖ 198 KB

## Abstract We review the use of the contactless methods of photoreflectance (PR), contactless electroreflectance (CER) and wavelength modulated differential surface photovoltage spectroscopy (DSPS) for the nondestructive, room temperature characterization of a wide variety of wafer‐scale III–V sem