## Abstract An application of artificial neural networks (ANNs) for accuracy improving of the microwave FETs (MESFET/HEMT, dual‐gate MESFET) noise modeling is presented in this paper. The proposed model is based on a basic transistor noise wave model, whose noise wave temperatures are assumed to be
Noise wave modeling of microwave transistors based on neural networks
✍ Scribed by Vera Marković; Olivera Pronić; Zlatica Marinković
- Publisher
- John Wiley and Sons
- Year
- 2004
- Tongue
- English
- Weight
- 96 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0895-2477
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✦ Synopsis
Abstract
The noise modeling of microwave FETs based on the noise‐wave representation of a transistor‐intrinsic circuit is considered. Frequency‐dependent noise‐wave temperatures are introduced as empirical model parameters and modeled using neural networks. In this way, online optimization in a circuit simulator is shifted to offline training of neural networks. An example of transistor‐noise modeling for one specified component is shown. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 41: 294–297, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20120
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