## Abstract In this study, we tried to consider various color appearance factors and device characterization together by visual experiment to simplify the across‐media color appearance reproduction. Two media, CRT display (soft‐copy) and NCS color atlas (hard‐copy), were used in our study. A total
Bias-dependent scalable modeling of microwave FETs based on artificial neural networks
✍ Scribed by Zlatica D. Marinković; Olivera R. Pronić; Vera V. Marković
- Publisher
- John Wiley and Sons
- Year
- 2006
- Tongue
- English
- Weight
- 299 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0895-2477
No coin nor oath required. For personal study only.
✦ Synopsis
A simple and efficient procedure for modeling of scattering and noise parameters for a class of microwave transistors manufactured in the same technology is presented in this article. It is based on multilayer perceptron artificial neural networks (ANN), whose inputs are device gate width, biases, and frequency that produce scattering and noise parameters at their outputs. After the ANN training, the scattering and noise parameters' prediction under different operating conditions for any device from the class requires only calculation of the ANN response, without changes in the ANN structure. Numerical examples for S-and noise parameters modeling for one specific series of pHEMT devices are presented to show the validity and effectiveness of this approach.
📜 SIMILAR VOLUMES
## Abstract An application of artificial neural networks (ANNs) for accuracy improving of the microwave FETs (MESFET/HEMT, dual‐gate MESFET) noise modeling is presented in this paper. The proposed model is based on a basic transistor noise wave model, whose noise wave temperatures are assumed to be
This paper expands upon reported methods for utilizing prior knowledge for reducing complexity of input-output relationships that an ANN must learn. Previously, two simple methods, difference method and prior knowledge input method, were demonstrated for new model developments. This paper utilizes k
## Abstract The noise modeling of microwave FETs based on the noise‐wave representation of a transistor‐intrinsic circuit is considered. Frequency‐dependent noise‐wave temperatures are introduced as empirical model parameters and modeled using neural networks. In this way, online optimization in a