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Bias-dependent scalable modeling of microwave FETs based on artificial neural networks

✍ Scribed by Zlatica D. Marinković; Olivera R. Pronić; Vera V. Marković


Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
299 KB
Volume
48
Category
Article
ISSN
0895-2477

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✦ Synopsis


A simple and efficient procedure for modeling of scattering and noise parameters for a class of microwave transistors manufactured in the same technology is presented in this article. It is based on multilayer perceptron artificial neural networks (ANN), whose inputs are device gate width, biases, and frequency that produce scattering and noise parameters at their outputs. After the ANN training, the scattering and noise parameters' prediction under different operating conditions for any device from the class requires only calculation of the ANN response, without changes in the ANN structure. Numerical examples for S-and noise parameters modeling for one specific series of pHEMT devices are presented to show the validity and effectiveness of this approach.


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