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Noise measurements in ion implanted MOSFETs : H. S. Park and A. Van der Ziel. Solid-St. Electron.26 (8) 747 (1983)

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 86 KB
Volume: 24
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(84)90625-5

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