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Noise injection as a measure of semiconductor component performance and degradation

✍ Scribed by D.J. Ager; P.S. Mylotte

Publisher: Elsevier Science
Year: 1977
Tongue: English
Weight: 725 KB
Volume: 16
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(77)90614-x

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