Noise injection as a measure of semiconductor component performance and degradation : D. J. Ager and P. S. Mylotte. Microelectron. Reliab. 16, 679 (1977)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 132 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90984-8