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Nitridation of Silica Characterized by High-Energy X-Ray Diffraction Technique

✍ Scribed by Toru Wakihara; Tomohiro Yamakawa; Junichi Tatami; Katsutoshi Komeya; Takeshi Meguro; Shinji Kohara

Book ID
109260245
Publisher
John Wiley and Sons
Year
2007
Tongue
English
Weight
241 KB
Volume
90
Category
Article
ISSN
0002-7820

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Characterization of InP porous layer by
Characterization of InP porous layer by high-resolution X-ray diffraction
✍ Punegov, V. I. ;Lomov, A. A. ;Shcherbachev, K. D. πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 502 KB

## Abstract A high resolution X‐ray diffraction method has been effectively used for the structural characterization of InP porous layers. It was revealed that strong diffuse scattering from pores around reciprocal lattice points does depend on the azimuth positions of samples. To extract structura