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Niobium nitride thin films for use in Josephson junctions

โœ Scribed by Cukauskas, E.; Carter, W.; Qadri, S.; Skelton, E.

Book ID
114647794
Publisher
IEEE
Year
1985
Tongue
English
Weight
480 KB
Volume
21
Category
Article
ISSN
0018-9464

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Microstructure control in Pb3Bi thin fil
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โœ R. Chicault; J.C. Villegier; M.C. Rossi ๐Ÿ“‚ Article ๐Ÿ“… 1984 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 562 KB

Investigation of Pb-Bi thin films deposited by thermal evaporation was made in the range of 22-40% of bismuth. Low temperature resistivity and critical superconductive temperature depend strongly on bismuth concentration. SIMS depth profiling, X-ray diffraction and TEM analysis allow us to identify