Microstructure control in Pb3Bi thin fil
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R. Chicault; J.C. Villegier; M.C. Rossi
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Article
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1984
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Elsevier Science
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English
⚖ 562 KB
Investigation of Pb-Bi thin films deposited by thermal evaporation was made in the range of 22-40% of bismuth. Low temperature resistivity and critical superconductive temperature depend strongly on bismuth concentration. SIMS depth profiling, X-ray diffraction and TEM analysis allow us to identify