Microstructure control in Pb3Bi thin films for Josephson junctions

✍ Scribed by R. Chicault; J.C. Villegier; M.C. Rossi

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 562 KB
• Volume: 24
• Category: Article
• ISSN: 0011-2275
• DOI: 10.1016/0011-2275(84)90008-0

✦ Synopsis

Investigation of Pb-Bi thin films deposited by thermal evaporation was made in the range of 22-40% of bismuth. Low temperature resistivity and critical superconductive temperature depend strongly on bismuth concentration.

SIMS depth profiling, X-ray diffraction and TEM analysis allow us to identify the mixture of crystallized HCP-Pb3Bi phase and other surface and internal phases. Drastic oxidation effects were observed on these layers; some additional thin film materials, such as indium and SiO were deposited upon Pb-Bi to reduce oxidation.

Low leakage currenL niobium-oxide-Pb3Bi junctions were made with these alloys as counter-electrodes.